The present single-ionization cross section of Sn6 + compared to the results of the present CADW calculations
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Figure 5. The present single-ionization cross section of Sn6 + compared to the results of the present CADW calculations. Same notation as in figure 2. The brackets with arrows denote energy ranges, where REDA processes involving 3d-subshell excitations are to be expected. The dark-shaded area at the bottom of the graph represents the total ionization contribution of the 4d75s and 4d74f excited-ion beam components with estimated fractions of 6% and 0.2%, respectively.
Electron-impact single-ionization cross sections of Snq + ions in charge states q = 4–13 with 4d[10 − (q − 4)] outer-shell configurations have been studied in the energy range from the corresponding thresholds up to 1000 eV. Absolute cross sections and fine-step energy-scan data have been measured employing the crossed-beams technique. Contributions of different ionization mechanisms have been analysed by comparing the experimental data with calculations employing the configuration-averaged distorted wave approximation. Ionization plasma rate coefficients inferred from the experimental data are also presented.